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Type | Title | Author | Comments | Last updated |
---|---|---|---|---|
Presentation | 2 × VDD tolerant I/O with Considerations of Hot-Carrier Degradation and Gate-Oxide Reliability | Dharmaray Nedalgi | 0 | 7 months ago |
Presentation | Novel Gate Tracking and N-well Control Circuit for 2 × VDD Tolerant I/O Buffer | Dharmaray Nedalgi | 0 | 7 months ago |