Video Not Available
Presentations
Mismatch Analysis of DTCs with an Improved BIST-TDC in 28nm CMOS
Presented Date:Jul 03, 07:12am UTCID: 455
Presenter(s): Peng Chen
Author(s): Peng Chen
Accurate and Fast On-wafer Test Circuitry Integrated with a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT
Presented Date:Jul 03, 07:12am UTCID: 126
Presenter(s): Dr. Long-Yi Lin
A 0.02–2-GHz Inductorless Two-Fold Noise-Canceling Low-Noise Amplifier in 28-nm CMOS
Presented Date:Jul 03, 07:12am UTCID: 253
Presenter(s): Amir Bozorg
Author(s): Amir Bozorg
An Independent Dynamic Dead-Time Control for Reliable High-Voltage High-Frequency Half-Bridge Converters
Presented Date:Jul 03, 07:12am UTCID: 254
Presenter(s): Mousa Karimi
Author(s): Mousa Karimi
Chairs
Chair(s)
Display Name
Marcello De Matteis
- Affiliation
-
AffiliationUniversity of Milano-Bicocca
- Country
Display Name
Yan Liu
- Affiliation
-
AffiliationShanghai Jiaotong University
- Country