ISICAS 2021
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Technical Lecture and Demo
ID 126

Accurate and Fast On-wafer Test Circuitry Integrated with a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT
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Presenter(s)
Dr. Long-Yi Lin Headshot
Dr. Long-Yi Lin
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Author(s)
Hao−Chiao Hong
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Dr. Long-Yi Lin
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Slides
  • Accurate and Fast On-wafer Test Circuitry Integrated with a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT (application/pdf)
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