For enabling Computation-in-Memory (CIM) concepts, memristive devices are generally integrated in a passive configuration or in an active configuration, where transistors are employed together with the memristive switches. However, the reliability and variability of the memristive devices might impact the performance of CIM circuits. In this work, we experimentally demonstrate the impact of device-to-device (D2D) and cycle-to-cycle (C2C) variability on a simple IMPLY logic gate realized in passive and active configurations. Our findings suggest that the success rate of the logic operation can be increased by exploiting the D2D variability in the memristive devices.