Details
Poster
Presenter(s)
![Elena-Diana Șandru Headshot](https://confcats-catavault.s3.amazonaws.com/CATAVault/ieeecass/master/files/styles/cc_user_photo/s3/user-pictures/83321.png?h=9f07f657&itok=8R8_yOmV)
Display Name
Elena-Diana Șandru
- Affiliation
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AffiliationUniversity Politehnica of Bucharest
- Country
Abstract
This paper presents a local sensitivity analysis methodology of circuit performances, i.e. Electrical Parameters (EPs), with manufacturing process variations, based on modelling the EPs dependence on the Process Control Monitor parameters. It can be used as an assisting tool for the designer, during the product characterization.