Profile

Xing Tong (S’17) was born in Zhuhai, China, in 1995. He received B.S, M.S. degrees from Rensselaer Polytechnic Institute, Troy, NY, USA, in 2018, and 2021, respectively. He is currently pursuing Ph.D. degree at Rensselaer Polytechnic Institute, and his research focus is mixed-signal IC design.

He was the recipient of the Rickett Prize of Rensselaer Polytechnic Institute in 2018, and Analog Device Outstanding Student Award in 2021.