Power transistors form the main component of automotive Integrated Circuits (ICs) and they handle several amperes of current (>2A). State of the Art is to integrate several power MOSFETs along with their gate drivers (including charge pumps or boost converters that supply the gate drivers) whose operating voltage range is from 5V to 60V. Reliability of these integrated gate drivers and power transistors is a key factor to meet the high-quality demands of the automotive applications. In this tutorial, challenges related to the design and reliability of circuits like LDOs, High Side (HS) drivers, Low Side (LS) drivers and configurable HS/ LS drivers are discussed along with information related to floating nodes, aging and reliability related concerns like NBTI/PBTI, HCI etc. and proven design techniques to simulate and mitigate these challenges. These gate drivers have to be thoroughly designed for robustness w.r.to. Electrical and Thermal Safe Operating Area (SOA) and its test methodology by shorting the outputs to ground and battery will be discussed. In this tutorial, Design FMEA (Failure Mode Effect Analysis) based analysis to mitigate risks at design and system level along with test concepts towards very low dppm (defective parts per million) will be discussed. This tutorial will be valuable for the design, product and test engineers developing ICs for automotive and industrial applications.