Details
Presenter(s)
![Guillaume Guérin Headshot](https://confcats-catavault.s3.amazonaws.com/CATAVault/ieeecass/master/files/styles/cc_user_photo/s3/user-pictures/81441.jpg?h=60914f74&itok=ugDaZqyB)
Display Name
Guillaume Guérin
- Affiliation
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AffiliationGeorgia Institute of Technology
- Country
Abstract
IV-overlap power losses play an important role in the overall conversion efficiency of a switched-inductor power supply, which is why a clear understanding of its mechanism is necessary. This paper proposes an insightful model with device-based expressions. The model accounts for the non-linear and dynamic behavior of gate capacitances in switching MOSFETs and reverse-recovery effects produced by interconnected diodes, which are largely absent in the state of the art. Calculated and simulated overlap losses with and without reverse recovery are within ±10%