A field programmable gate array (FPGA), a widely used integrated circuit, uses a serial configuration in which circuit information is transferred in a serial manner. Such serial configuration circuits, however, are vulnerable to radiation. Therefore, we have suggested an optically reconfigurable gate array (ORGA) that uses optical reconfiguration. This paper reports the result of a total dose tolerance analysis that was made for the ORGA VLSI. Results confirmed that the ORGA VLSI with an absorbed dose of 290 Mrad (2900 kGy) operated properly. The rate of performance deterioration of the circuit attributable to its delay time was approximately 11.9%.