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    Details
    Author(s)
    Display Name
    Yoontae Jung
    Affiliation
    Affiliation
    KAIST
    Display Name
    Soon-Jae Kweon
    Affiliation
    Affiliation
    New York University Abu Dhabi
    Display Name
    Hyuntak Jeon
    Affiliation
    Affiliation
    Chungbuk National University
    Display Name
    Jeongeun Lee
    Affiliation
    Affiliation
    Samsung Electronics Co., Ltd.
    Display Name
    Youngin Kim
    Affiliation
    Affiliation
    ETH Zürich
    Display Name
    Sein Oh
    Affiliation
    Affiliation
    Korea Advanced Institute of Science and Technology
    Display Name
    Jimin Koo
    Affiliation
    Affiliation
    Korea Advanced Institute of Science and Technology
    Display Name
    Minkyu Je
    Affiliation
    Affiliation
    Korea Advanced Institute of Science and Technology
    Abstract

    A super-high-resolution capacitance-to-digital converter (CDC) reaching sub-aF capacitance resolution is proposed. The CDC employs continuous-time (CT) low-noise capacitance-to-voltage converters (CVC) followed by a high linearity bandpass ΔΣ ADC (BP-ΔΣM) without any frequency demodulation. Without the demodulation and a narrow-band sensing technique, the proposed CDC achieves sub-aF capacitance resolution while enlarging the input capacitance range with a coarse C-DAC calibration loop. The proposed circuit has been implemented in a 0.35 um CMOS process with 3.3 V power supply voltage. The CDC shows a capacitance resolution of 0.98 aFrms with a capacitance range of 3.1 pF while consuming 4.16 mW.