The Root-of-Trust (RoT) requires True Random Number Generators (TRNG), Physical Unclonable Functions (PUF) and non-volatile memories for essential key generation and identity authentication. However, these implementations introduce challenges due to the physical phenomena used in each primitive, requiring complex calibration or special technologies with additional masks. This work describes a unified NVRAM-PUF-TRNG implementation in 180-nm CMOS technology. The PUF and TRNG primitives are based on the NVRAM metastability in the sense amplifier. The TRNG passes the statistical and entropy test provided by NIST. The PUF exhibits 49.85% of uniformity, 48.12% of uniqueness and 99.58% of reliability in nominal conditions.