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Video s3
    Details
    Presenter(s)
    Yifan He Headshot
    Display Name
    Yifan He
    Affiliation
    Affiliation
    Tsinghua University
    Country
    Author(s)
    Display Name
    Yifan He
    Affiliation
    Affiliation
    Tsinghua University
    Display Name
    Yuxuan Huang
    Affiliation
    Affiliation
    Tsinghua University
    Display Name
    Jinshan Yue
    Affiliation
    Affiliation
    Institute of Microelectronics, Chinese Academy of Sciences
    Display Name
    Wenyu Sun
    Affiliation
    Affiliation
    Tsinghua University
    Display Name
    Lu Zhang
    Affiliation
    Affiliation
    Tsinghua University
    Display Name
    Yongpan Liu
    Affiliation
    Affiliation
    Tsinghua University
    Abstract

    Previous RRAM-based computing-in-memory works mainly focus on the current-domain approach. However, the performance and accuracy of current computation are limited by large read currents of RRAM cells and their variations. This work presents a novel RRAM-based charge-domain computation design C-RRAM to resolve these limitations. Specifically, each RRAM cell is used to control the discharging of a capacitor through an additional transistor. The resistance variations can be tolerated with sufficient discharging time. Also, the output from each cell is accumulated by charge sharing instead of summing currents to eliminate the static current path in readout circuits. In this way, robust and efficient RRAM-based CIM operation is enabled with fully input parallelism. A 512×514 RRAM array is implemented to evaluate the benefits of the proposed charge-domain approach. The experiment results show that C-RRAM can suppress the output variations by 41× and incur negligible accuracy loss for ResNet-18 on Cifar10 dataset. Compared to previous current-domain RRAM designs, it achieves 1.2× energy efficiency and 127× area efficiency due to reduced A/D conversions and improved parallelism.

    Slides
    • C-RRAM: A Fully Input Parallel Charge-Domain RRAM-Based Computing-in-Memory Design with High Tolerance for RRAM Variations (application/pdf)