The efficiency of a Memory BIST for embedded memory testing depends on the fault coverage of the implemented test algorithm. The fault detection performance analysis on a March algorithm is indispensable to determine its fault coverage. This analysis process is very tedious and time-consuming, since there are many fault models to be analyzed, and their sensitizers and detectors must be identified within the algorithm test operation sequences. This paper presents the development of an automation program that is capable to analyze a March algorithm fault detection performance autonomously. It comprises of reading and extracting information from the input algorithm, identifying the value trend of the memory cells, identifying the pair of sensitizer and detector of each fault model, and finally producing a detailed fault detection analysis result and the fault coverage. The output results from the proposed automation program execution show the identical fault detection analysis as the manual analysis, which was completed in less than 3 ms.