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Video s3
    Details
    Author(s)
    Display Name
    Adam Waks
    Affiliation
    Affiliation
    Université de Bordeaux
    Display Name
    Olivier Crand
    Affiliation
    Affiliation
    NXP Semiconductors N.V.
    Display Name
    Olivier Tesson
    Affiliation
    Affiliation
    NXP Semiconductors N.V.
    Display Name
    Thierry Taris
    Affiliation
    Affiliation
    IMS Bordeaux
    Affiliation
    Affiliation
    Univ. of Bordeaux
    Abstract

    A Built-in Test Equipment (BITE) to measure the phase of the channel in front-end phased array ICs is presented. A built-in measurement algorithm is employed which enables a compact design approach. A frequency divider is used as quadrature generator, amplifier, limiter, and frequency scaler (all-in-one), for reduced circuitry and complexity. A proof of concept of the proposed BITE is fabricated in an in-house BiCMOS process. The size of the BITE is 0.026 square millimeters, and the measured phase accuracy at 30.5 GHz is with an RMS error of 5.2 degrees.