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Presenter(s)
![Antonio Aprile Headshot](https://confcats-catavault.s3.amazonaws.com/CATAVault/ieeecass/master/files/styles/cc_user_photo/s3/user-pictures/80351.jpg?h=fbf7a813&itok=rMDiD-Jc)
Display Name
Antonio Aprile
- Affiliation
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AffiliationUniversità degli Studi di Pavia
- Country
Abstract
This paper presents an extensive comparison between the temperature-related performance of BJT and MOS devices on the basis of simulated and experimental results collected from two different test chips, one for each sensing type, in the -40°C to +80°C temperature range; their performance is analyzed in terms of sensitivity, susceptibility to mismatch variations, inaccuracy, linearity and noise.