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    Author(s)
    Display Name
    Orian Leitersdorf
    Affiliation
    Affiliation
    Technion – IL Institute of Technology
    Display Name
    Ronny Ronen
    Affiliation
    Affiliation
    Technion – IL Institute of Technology
    Display Name
    Shahar Kvatinsky
    Affiliation
    Affiliation
    Technion – IL Institute of Technology
    Abstract

    Processing-in-memory (PIM) solutions vastly accelerate systems. Memristors possess a unique property that enables storage and logic within the same device, which is exploited in the memristive Memory Processing Unit (mMPU). The mMPU expand stateful logic techniques, such as IMPLY, MAGIC and FELIX, to high-throughput parallel logic and arithmetic operations. Unfortunately, the mMPU is highly vulnerable to soft errors and this massive parallelism is not compatible with traditional reliability techniques. In this paper, we discuss reliability techniques that efficiently support the mMPU by utilizing the same principles as the mMPU computation. The short-term and long-term reliability of large-scale applications are evaluated.