Increase in automotive design complexity and safety requirements are highly attributed to the enforcement of ISO 26262 standards. This requires an advanced SoC DFT architecture with Power-On-Self-Test (POST) during power-up sequences and In-System-Test (IST) during functional operation. The designed DFT architecture must satisfy the factors such as high test coverage, faster run time, and safe isolation of the target test logic while supporting memory BIST, incremental memory repair, and logic BIST. In this paper, we propose an advanced safety test solution for an effective in-field POST, IST, and production testing that also meets the quality and reliability standards defined by ISO 26262.