Skip to main content
Video s3
    Details
    Presenter(s)
    Ryosuke Watanabe Headshot
    Display Name
    Ryosuke Watanabe
    Affiliation
    Affiliation
    Hirosaki University
    Country
    Country
    Japan
    Author(s)
    Display Name
    Ryosuke Watanabe
    Affiliation
    Affiliation
    Hirosaki University
    Display Name
    Shigeru Hidaka
    Affiliation
    Affiliation
    Nikkohm. Co., Ltd.
    Display Name
    Tomoya Akasaka
    Affiliation
    Affiliation
    Hirosaki University
    Display Name
    Shota Kajiya
    Affiliation
    Affiliation
    Hirosaki University
    Display Name
    Taisei Arima
    Affiliation
    Affiliation
    Hirosaki University
    Display Name
    Atsushi Kurokawa
    Affiliation
    Affiliation
    Hirosaki University
    Display Name
    Toshiki Kanamoto
    Affiliation
    Affiliation
    Hirosaki University
    Abstract

    This paper reveals a durable trimming condition of thin film resistors as a part of snubber circuits in high power electronic modules including IGBT converters. Our previous study clarified that the maximum voltage to apply to the resistors is limited by thermal destruction of the resistors due to the pulsed power injection. With careful failure analysis and surface observations, this paper provides an additional insight that dimensions of the indispensable trimming patterns affect the thermal destruction. Electro-thermal analysis results show that the optimized dimensions of the trimmed shapes can suppress temperature rise of the most critical area up to one sixth compared to the most pessimistic shape.

    Slides
    • [SHORT] Enhanced Laser Trimming of Thin Film Resistors Dedicated to Snubber for High Power IGBT Modules (application/pdf)