This work proposes rapid synthesis of analog built- in self-test (BIST) circuits using a streamlined design methodology that pulls BIST circuit architecture(s) from a library of components and synthesizes the circuit(s) using a circuit-level design automation (DA) algorithm that combines Multivariate Regression models with Geometric Programming optimization. The presented design methodology is verified through the design of two current-sense BIST circuits for insertion into two different DC-DC converter applications. For each of the two experimental cases, a topology is automatically selected for BIST current sensing, and then the BIST circuit is rapidly sized using the presented DA algorithm.