Power side-channel (PSC) attacks have recently gained popularity to break into cyber-physical systems due to their non-invasiveness and proven effectiveness. In the CMOS circuit, the power dissipation when output transitions from `0\' to `1\' is different compared to the transition from `1\' to `0\'. The difference in power consumption results in input-dependent correlation, used for PSC to infer secret keys. This is the first work to investigate the impact of PSC on NCFET at the device level. For the first time, we demonstrate using Gate Work Function engineering to mitigate PSC attacks effectively.