Details
Poster
Presenter(s)
Display Name
Alfio Di Mauro
- Affiliation
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AffiliationETH Zürich
- Country
Abstract
In this demo, we show how the effect of process variations can be statically mitigated on a chip fabricated in 22nmFDX technology, thanks to the application of a Body-Biasing (BB) voltage, which is capable to trim the performance of the circuit.