Details
Poster
Presenter(s)
![Carmine Paolino Headshot](https://confcats-catavault.s3.amazonaws.com/CATAVault/ieeecass/master/files/styles/cc_user_photo/s3/user-pictures/11271.jpg?h=fbf7a813&itok=9e0NTFBM)
Display Name
Carmine Paolino
- Affiliation
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AffiliationPolitecnico di Torino
- Country
Abstract
Performance in analog integrated circuits strongly depends on the mismatch between nominally identical devices. In this work we derive closed-form asymptotic expressions describing mismatch variance in multifinger structures, under the assumption of Gaussian autocorrelation for the mismatch-generating stochastic process. The analysis is performed on interdigitated geometries, eventually modified to make them common-centroid. Comparison with the numerical results provided by an independent model validates the theoretical expressions presented here.