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Video s3
    Details
    Poster
    Presenter(s)
    Gaku Ogihara Headshot
    Display Name
    Gaku Ogihara
    Affiliation
    Affiliation
    Gunma University
    Country
    Country
    Japan
    Author(s)
    Display Name
    Gaku Ogihara
    Affiliation
    Affiliation
    Gunma University
    Display Name
    Takayuki Nakatani
    Affiliation
    Affiliation
    Gunma University
    Display Name
    Daisuke Iimori
    Affiliation
    Affiliation
    Gunma University
    Display Name
    Shogo Katayama
    Affiliation
    Affiliation
    Gunma University
    Display Name
    Anna Kuwana
    Affiliation
    Affiliation
    Gunma University
    Display Name
    Keno Sato
    Affiliation
    Affiliation
    ROHM Semiconductor
    Display Name
    Takashi Ishida
    Affiliation
    Affiliation
    ROHM Semiconductor
    Display Name
    Toshiyuki Okamoto
    Affiliation
    Affiliation
    ROHM Semiconductor
    Display Name
    Tamotsu Ichikawa
    Affiliation
    Affiliation
    ROHM Semiconductor
    Display Name
    Yujie Zhao
    Affiliation
    Affiliation
    Gunma University
    Display Name
    Jianglin Wei
    Affiliation
    Affiliation
    Gunma University
    Display Name
    Kazumi Hatayama
    Affiliation
    Affiliation
    Gunma University
    Abstract

    This paper describes a fast and accurate nan-ampere current measurement method for mass production shipping stage testing, and its engineering evaluation of measured data variation with different conditions. The proposed method employs the IV conversion and the DC-AC conversion to suppress the low frequency noise effects and to enable multi-channel measurement. We have obtained the statistics of the measurement data with several sampling frequencies, moving averaging processing, several numbers of data and two source resistors, and its results show that the current as low as 0.02pA can be measured with good linearity and testing time of several tens of milli seconds.

    Slides
    • Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production (application/pdf)